Electricity: measuring and testing – Testing potential in specific environment
Reexamination Certificate
2011-04-12
2011-04-12
Dole, Timothy J (Department: 2858)
Electricity: measuring and testing
Testing potential in specific environment
C327S170000, C327S333000
Reexamination Certificate
active
07923982
ABSTRACT:
A semiconductor integrated circuit is provided with a voltage level detector which detects a voltage level of a signal wire, and a transition time detector which detects a time length of a transition period during which the signal wire changes from an inactive voltage state to an active voltage state based on the voltage level detected by the voltage level detector. The voltage level detector detects the voltage level of the signal wire during the transition period.
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Dole Timothy J
Hoque Farhana
McDermott Will & Emery LLP
Panasonic Corporation
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