Semiconductor integrated circuit

Electricity: measuring and testing – Testing potential in specific environment

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C327S170000, C327S333000

Reexamination Certificate

active

07923982

ABSTRACT:
A semiconductor integrated circuit is provided with a voltage level detector which detects a voltage level of a signal wire, and a transition time detector which detects a time length of a transition period during which the signal wire changes from an inactive voltage state to an active voltage state based on the voltage level detected by the voltage level detector. The voltage level detector detects the voltage level of the signal wire during the transition period.

REFERENCES:
patent: 5949249 (1999-09-01), Preuss et al.
patent: 6278305 (2001-08-01), Tanaka
patent: 6856175 (2005-02-01), Wodnicki
patent: 6864731 (2005-03-01), Zumkehr et al.
patent: 6927610 (2005-08-01), Callahan, Jr.
patent: 04-258015 (1992-09-01), None
patent: 11-112347 (1999-04-01), None
patent: 11-317649 (1999-11-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor integrated circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2729666

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.