Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2011-04-26

2011-04-26

Barbee, Manuel L (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S120000, C324S527000

Reexamination Certificate

active

07933735

ABSTRACT:
A semiconductor integrated circuit having a test circuit for collecting test data at any time based on interaction with an external source is provided. A communication circuit receives a data frame that is transferred to a data buffer. Data portions are transferred to a test unit of a test circuit. A counter starts a count operation based on a system clock when count information is transferred. If one of the data portions indicates the transferred data is test data, and another portion indicates a data collection specification command, the test unit outputs decoded address data to interact with a circuit-under-test when the counter completes the count operation based on another portion of the frame. A data buffer is supplied with the address data to facilitate storage of the data transferred from the circuit-under-test.

REFERENCES:
patent: 5673273 (1997-09-01), Almy
patent: 6324669 (2001-11-01), Westby
patent: 2004/0107396 (2004-06-01), Barone et al.
patent: 2006/0009252 (2006-01-01), Iida et al.
patent: A-5-36904 (1993-02-01), None
patent: A-H8-063450 (1996-03-01), None
patent: A-2002-318264 (2002-10-01), None
patent: A-2004-333246 (2004-11-01), None
patent: A-2007-58659 (2007-03-01), None
Office Action dated Jan. 9, 2009 in corresponding JP application No. 2007-219746 (and English Translation).

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