Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

1992-05-19

1994-04-12

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, G01R 3128

Patent

active

053028929

ABSTRACT:
An integrated circuit (IC 101) has ECL circuits (E3 to En). Bias current (I3) applied to the ECL circuit (E3) is fed by a current mirror circuit consisting of transistors (Q3 and Q1) and resistors (R2 and R3). Constant current (IO) flows in the transistor (Q1) by a constant current circuit (4). The transistor (Q1) has its collector connected to one end of a resistor (R1), the other end of which is connected to a test terminal (2). With an outside resistor (Rb) connected to the test terminal (2) of the integrated circuit (IC 101), part of the constant current (IO) is pulled out to the outside, and the current flowing in the resistor (R2) becomes small. Accordingly, the bias current (I3) is reduced. A voltage difference .DELTA.V of logic states in the ECL circuit (E3) can be controlled from the outside without controlling a temperature, and a test of an inferior transistor the ECL circuit (E3) has can be performed.

REFERENCES:
patent: 4697095 (1987-09-01), Fujii
patent: 4942358 (1990-07-01), Davis et al.

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2101274