Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-02-08
2011-02-08
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090, C324S761010, C324S765010
Reexamination Certificate
active
07884632
ABSTRACT:
In a semiconductor inspecting device having a contact to be electrically connected to an electrode pad formed in a semiconductor device which is an object to be measured, and a substrate provided with the contact, the contact is provided obliquely to a main surface of the substrate.
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Aizawa Mitsuhiro
Higashi Mitsutoshi
Murayama Kei
Shiraishi Akinori
Yamagishi Katsunori
Chan Emily Y
Drinker Biddle & Reath LLP
Nguyen Ha Tran T
Shinko Electric Electric Industries Co., Ltd.
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