Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Having graded composition
Reexamination Certificate
2008-05-20
2008-05-20
Andujar, Leonardo (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
Having graded composition
C257S183000, C257SE21125
Reexamination Certificate
active
10646353
ABSTRACT:
Dislocation pile-ups in compositionally graded semiconductor layers are reduced or eliminated, thereby leading to increased semiconductor device yield and manufacturability. This is accomplished by introducing a semiconductor layer having a plurality of threading dislocations distributed substantially uniformly across its surface as a starting layer and/or at least one intermediate layer during growth and relaxation of the compositionally graded layer. The semiconductor layer may include a seed layer disposed proximal to the surface of the semiconductor layer and having the threading dislocations uniformly distributed therein.
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Currie Matthew
Leitz Christopher
Vineis Christopher
Westhoff Richard
Yang Vicky
AmberWave Systems Corporation
Andujar Leonardo
Goodwin & Procter LLP
Qiunto Kevin
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