Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-06-26
2007-06-26
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
11146008
ABSTRACT:
A semiconductor facility. The semiconductor facility comprises a printed circuit board (PCB), a heat source, and an adjusting device. The PCB comprises a first surface and a second surface. The heat source provides heat for a first fluid around the PCB to steadily heat up the PCB. The temperature of the first surface is adjusted to be lower than that of the second surface by the adjusting device such that the PCB is rapidly deformed to a stable state.
REFERENCES:
patent: 6552561 (2003-04-01), Olsen et al.
patent: 6711961 (2004-03-01), Theriault et al.
patent: 6891385 (2005-05-01), Miller
patent: 2002/0050834 (2002-05-01), Olsen et al.
Chen Yu-Shu
Chiang Te-Hsing
Liu Yu-Hsin
Birch & Stewart Kolasch & Birch, LLP
Nguyen Ha Tran
Nguyen Tung X.
Powerchip Semiconductor Corp.
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