Active solid-state devices (e.g. – transistors – solid-state diode – Avalanche diode – With means to limit area of breakdown
Reexamination Certificate
2008-05-23
2011-10-11
Ngo, Ngan (Department: 2893)
Active solid-state devices (e.g., transistors, solid-state diode
Avalanche diode
With means to limit area of breakdown
C257S603000, C257S481000, C257SE29335
Reexamination Certificate
active
08035195
ABSTRACT:
A semiconductor element includes a semiconductor layer having a first doping density, a metallization, and a contact area located between the semiconductor layer and the metallization. The contact area includes at least one first semiconductor area that has a second doping density higher than the first doping density, and at least one second semiconductor area in the semiconductor layer. The second semiconductor area is in contact with the metallization and provides lower ohmic resistance to the metallization than a direct contact between the semiconductor layer and the metallization provides or would provide.
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Niedernostheide Franz Josef
Pfaffenlehner Manfred
Schulze Hans-Joachim
Infineon - Technologies AG
Liu Benjamin Tzu-Hung
Ngo Ngan
Slater & Matsil L.L.P.
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