Semiconductor dynamic quantity sensor

Measuring and testing – Dynamometers – Responsive to force

Reexamination Certificate

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C257S419000

Reexamination Certificate

active

06938501

ABSTRACT:
A semiconductor dynamic quantity sensor detects a dynamic force and a fault diagnosis through the use of a single bridge circuit. Sensor output terminals are connected to midpoints between gauge resistors to make a combination of the midpoints at which an equal electric potential is measured when no pressure is applied to a diaphragm of the sensor. Fault diagnostic output terminals are connected to wiring patterns in the same manner as the first output terminals. One of the sensor output terminals has three selectable terminals connected to different positions of the midpoint. One of the diagnostic output terminals also has three selectable terminals connected to different positions of the wiring patterns. Accordingly, an offset voltage of the sensor output and the fault diagnostic output can be adjusted appropriately when one of the selectable terminals are selected as appropriate.

REFERENCES:
patent: 6422088 (2002-07-01), Oba et al.
patent: 2002/0100948 (2002-08-01), Yoshihara et al.
patent: A-H10-170370 (1998-06-01), None

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