Static information storage and retrieval – Powering
Reexamination Certificate
2007-05-08
2007-05-08
Nguyen, VanThu (Department: 2824)
Static information storage and retrieval
Powering
C365S225700, C327S538000, C324S765010
Reexamination Certificate
active
11187431
ABSTRACT:
A semiconductor die includes at least one process monitoring circuit for evaluating at least one process parameter of the semiconductor die. The at least one process monitoring circuit can include a first group of process monitoring circuits for monitoring NFET speed and a second group of process monitoring circuits for monitoring PFET speed. The process monitoring circuits can be distributed at the corners of the semiconductor die. The semiconductor die further includes a voltage control circuit configured to store optimum voltage information corresponding to the at least one process parameter. The voltage control circuit is further configured to selectively provide the optimum voltage information to a system power supply. The voltage control circuit includes a calculated optimum voltage register that stores the optimum voltage information corresponding to the at least one process parameter.
REFERENCES:
patent: 6211727 (2001-04-01), Carobolante
patent: 6897674 (2005-05-01), Braceras et al.
patent: 7060566 (2006-06-01), Vogelsang
patent: 2005/0162181 (2005-07-01), Braceras et al.
Borden Craig E.
Ding Chih-Shun
Majors Steve
Matloubian Mishel
Farjami & Farjami LLP
Mindspeed Technologies Inc.
Nguyen Van-Thu
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