Semiconductor devices with improved turn-off characteristics

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

357 15, 357 13, 357 65, 357 90, H01L 2972, H01L 2948, H01L 2990, H01L 2348

Patent

active

040472183

ABSTRACT:
Semiconductor devices, with especial reference to transistors with reduced turn-off times. This improvement includes a low-barrier height metal contact to one of the lightly-doped regions of the device as a replacement for the conventional heavily-doped region or high-low junction structure usually employed for the purpose of providing ohmic contact.

REFERENCES:
patent: 3930909 (1976-01-01), Schmitz et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor devices with improved turn-off characteristics does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor devices with improved turn-off characteristics, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor devices with improved turn-off characteristics will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2166752

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.