Patent
1976-07-16
1977-09-06
Wojciechowicz, Edward J.
357 15, 357 13, 357 65, 357 90, H01L 2972, H01L 2948, H01L 2990, H01L 2348
Patent
active
040472183
ABSTRACT:
Semiconductor devices, with especial reference to transistors with reduced turn-off times. This improvement includes a low-barrier height metal contact to one of the lightly-doped regions of the device as a replacement for the conventional heavily-doped region or high-low junction structure usually employed for the purpose of providing ohmic contact.
REFERENCES:
patent: 3930909 (1976-01-01), Schmitz et al.
Clark Lowell E.
Roop Raymond M.
Volk Charles E.
Clark Lowell E.
Motorola Inc.
Wojciechowicz Edward J.
LandOfFree
Semiconductor devices with improved turn-off characteristics does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor devices with improved turn-off characteristics, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor devices with improved turn-off characteristics will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2166752