Semiconductor device with trench type device isolation layer...

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation

Reexamination Certificate

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Details

C438S221000, C438S296000, C438S359000, C257SE21546

Reexamination Certificate

active

07579664

ABSTRACT:
Disclosed are a semiconductor device with a device isolation structure and a method for fabricating the same. The method includes the steps of: forming a plurality of trenches defining first active regions by etching a substrate in a predetermined depth; forming a plurality of first device isolation layers in inner sides of the plurality of trenches; forming a plurality of second device isolation layers on the plurality of first device isolation layers as remaining a space opening an upper portion of each first active region disposed between the second device isolation layers; and forming a plurality of second active regions connected to the first active region between the second device isolation layers.

REFERENCES:
patent: 6146970 (2000-11-01), Witek et al.
patent: 6613645 (2003-09-01), Fukaura
patent: 2003/0006476 (2003-01-01), Chen et al.
patent: 2003/0011044 (2003-01-01), Oh et al.
patent: 2003/0077891 (2003-04-01), Drynan
patent: 2004/0070023 (2004-04-01), Kim et al.
patent: 2004/0235257 (2004-11-01), Johansson et al.
patent: 2005/0277261 (2005-12-01), Jung
patent: 09-252049 (1997-09-01), None
patent: 10-2004-0059394 (2004-05-01), None
patent: 10-2006-0000581 (2006-06-01), None

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