Semiconductor device with thermal fault detection

Details Semiconductor device with thermal fault detection Semiconductor device with thermal fault detection

2009-11-06

2011-10-25

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

08044674

ABSTRACT:
A semiconductor device with a thermal fault detection is disclosed. According to one example of the invention such a semiconductor device includes a semiconductor chip including an active area. It further includes a temperature sensor arrangement that provides a measurement signal dependent on the temperature in or close to the active area, the measurement signal having a slope of a time-dependent steepness, and an evaluation circuit that is configured to provide an output signal that is representative of the steepness of the slope of the measurement signal and further configured to signal a steepness higher than a predefined threshold.

REFERENCES:
patent: 5625288 (1997-04-01), Snyder et al.
patent: 7268575 (2007-09-01), Chen et al.

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