Semiconductor device with test circuit

Details Semiconductor device with test circuit Semiconductor device with test circuit

1998-03-19

2000-05-09

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

365201, 324550, G01R 3102

Patent

active

060608994

ABSTRACT:
In a semiconductor circuit device, a wiring line is connected to an internal circuit and to a test circuit which is connected to a power supply voltage line and a ground voltage line. The test circuit includes a first fuse resistor connected to the power supply voltage line, a first resistor connected between the first fuse resistor and the ground voltage line, a second resistor connected to the power supply voltage line, a second fuse resistor connected between the second resistor and the ground voltage line, a p-type transistor and an n-type transistor. The p-type transistor has a first drain connected to the wiring line, a first source connected to the power supply voltage line, and a gate connected to a connection point between the first fuse resistor and the first resistor. Also, the n-type transistor has a second drain connected to the wiring line, a second source connected to the ground voltage line, and a second gate connected to a connection point between the second resistance and the second fuse resistor.

REFERENCES:
patent: 4158147 (1979-06-01), Edwards
patent: 4837520 (1989-06-01), Golke et al.
patent: 5557573 (1996-09-01), McClure
patent: 5726945 (1998-03-01), Ukita et al.
patent: 5905683 (1999-05-01), McClure

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