Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Temperature
Reexamination Certificate
2007-12-11
2007-12-11
Pert, Evan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Temperature
C257S370000, C257S414000, C257S469000, C257SE27008, C257SE27015
Reexamination Certificate
active
11240853
ABSTRACT:
A semiconductor device is disclosed. In one embodiment the semiconductor device includes a semiconductor body of which is integrated a temperature sensor for measuring the temperature prevailing in the semiconductor body. The temperature sensor has a MOS transistor and a bipolar transistor. The MOS transistor is integrated into the semiconductor body nd configured such that the substhreshold current intensity of the MOS transistor is proportional to the temperature to be measured. The subthreshold current of the MOS transistor is amplified by the bipolar transistor.
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Streetman/Banerjee, Solid State Electronic Devices, 2000, Prentice Hall, Fifth Edition, pp. 301 & 302.
Krischke Norbert
Meyer Thorsten
Zundel Markus
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Pert Evan
Rodela Eduardo A.
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