Semiconductor device with process monitor circuit and test...

Details Semiconductor device with process monitor circuit and test... Semiconductor device with process monitor circuit and test...

2005-02-08

2005-02-08

Deb, Anjan K. (Department: 2858)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

C324S763010, C324S765010, C714S030000

Reexamination Certificate

active

06853177

ABSTRACT:
The invention provides a semiconductor device capable of appropriately debugging any fluctuation in element characteristic even when the element characteristic fluctuates exceeding a value estimated at the designing stage. This semiconductor device includes a process monitor circuit that monitors any fluctuation in process and outputs a monitor signal M representing a result of monitoring, in addition to circuit blocks that perform respectively required functions. And a timing control circuit that controls timing of an input signal inputted to a predetermined circuit element forming the circuit blocks based on the monitor signal M from the process monitor circuit is provided in the circuit blocks.

REFERENCES:
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patent: 6263463 (2001-07-01), Hashimoto
patent: 6556021 (2003-04-01), Nguyen et al.
patent: 6738934 (2004-05-01), Frank et al.
patent: 9-127186 (1997-05-01), None
patent: 2000-12639 (2000-01-01), None

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