Semiconductor device with multipurpose pad

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S1540PB

Reexamination Certificate

active

07425840

ABSTRACT:
It is provided a semiconductor device with an ability to receive various test signals and check test results in spite of a limited number of pads. The semiconductor device includes a signal transferring unit for transferring a power signal input through a multipurpose pad into a core area or delivering a test signal between the multipurpose pad and the core area while operating in a test mode and a test mode controlling unit for controlling the signal transferring unit to transfer one of the power voltage and the test signal.

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Korean Notice of Allowance issued in Korean Patent Application No. KR 10-2006-0083743, mailed Sep. 21, 2007 and English Translation.
Korean Office Action issued in Korean Patent Application No. KR 10-2006-0083743, mailed Sep. 21, 2007.

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