Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-03-22
2008-12-30
Hollington, Jermele M (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07471099
ABSTRACT:
A semiconductor device includes a plurality of signal terminals, a first power supply terminal, a second power supply terminal, a core circuit coupled to the plurality of signal terminals and the first power supply terminal, a plurality of first transistors coupled between the respective signal terminals and the second power supply terminal, and a plurality of second transistors coupled between the respective signal terminals and a ground potential, wherein the core circuit is configured to make the first transistors conductive and nonconductive alternately and make the second transistors nonconductive and conductive alternately at a time of test operation, such that one of a first transistor and a second transistor being conductive with respect to a given signal terminal requires another one of the first transistor and the second transistor to be nonconductive with respect to the given signal terminal.
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English translation of JP-07-098359A.
English translation of JP-07-225258A.
English translation of JP-10-082834A.
Kurita Yuji
Nishiwaki Hitoaki
Yamashita Hiroyoshi
Arent Fox LLP.
Fujitsu Limited
Hollington Jermele M
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