Semiconductor device with high speed switching of test modes

Details Semiconductor device with high speed switching of test modes Semiconductor device with high speed switching of test modes

2005-03-22

2005-03-22

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C365S201000

Reexamination Certificate

active

06870383

ABSTRACT:
A semiconductor device includes a first terminal which receives a signal within a predetermined potential range in a first operation mode, and receives a potential higher above the predetermined potential range in a second operation mode, a high potential detection circuit which is connected to the first terminal, and detects the high potential to generate a high potential detection signal, a second terminal which receives a command signal, a latch circuit which latches the command signal supplied to the second terminal in response to the high potential detection signal, and a third terminal which resets the latch circuit in response to a signal within the predetermined potential range supplied from an exterior of the device.

REFERENCES:
patent: 4357703 (1982-11-01), Van Brunt
patent: 4743841 (1988-05-01), Takeuchi
patent: 5526364 (1996-06-01), Roohparvar
patent: 5596537 (1997-01-01), Sukegawa et al.
patent: 5627478 (1997-05-01), Habersetzer et al.
patent: 5651011 (1997-07-01), Keeth
patent: 5727001 (1998-03-01), Loughmiller

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