Semiconductor device with DRAM cell and method of...

Semiconductor device manufacturing: process – Making passive device – Trench capacitor

Reexamination Certificate

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Details

C438S243000, C438S244000, C257S301000, C257SE21396, C257SE27092

Reexamination Certificate

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11235210

ABSTRACT:
A method of manufacturing a semiconductor device includes forming a trench in a semiconductor substrate, isotropically forming a trench surface insulating film on an inner surface of the trench, the trench surface insulating film including a deep part functioning as a capacitor insulating film, forming a surface layer side insulating film on the inner surface of the trench so that the surface layer side insulating film is continuously rendered thinner from the surface side of the substrate toward the deep side of the trench, and forming an electrode layer inside the surface layer side insulating film and the trench surface insulating film both formed on the inner surface of the trench.

REFERENCES:
patent: 6750111 (2004-06-01), Schrems
patent: 2003-60079 (2003-02-01), None

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