Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Bump leads
Reexamination Certificate
2005-08-23
2005-08-23
Cao, Phat X. (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Bump leads
C257S738000
Reexamination Certificate
active
06933607
ABSTRACT:
A semiconductor device includes a semiconductor substrate, a plurality of electrode pads aligned on the semiconductor substrate, and a plurality of bump electrodes placed on each electrode pad, wherein the plurality of bump electrodes on the electrode pad are aligned in a direction orthogonal to a direction where the electrode pads are aligned. A manufacturing method of the semiconductor device includes the steps of patterning a photoresist which serves as a bump electrode forming use mask on the semiconductor substrate having formed thereon the electrode pads and forming a bump electrode in a perpendicular straight wall shape to be thinner than the photoresist by plating the bump electrode forming use metal to the electrode pad.
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Japanese Office Action mailed Feb. 10, 2004 (w/English translation).
U.S. Appl. No. 08/989,328 filed Dec. 11, 1997.
U.S. Appl. No. 10/283,212 filed Oct. 30, 2002.
Chikawa Yasunori
Inohara Akio
Kanda Makoto
Nie Norimitsu
Ono Atsushi
Cao Phat X.
Nixon & Vanderhye P.C.
Sharp Kabushiki Kaisha
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