Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation
Reexamination Certificate
2006-06-07
2010-02-16
Landau, Matthew C (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Electromagnetic or particle radiation
C257S751000, C257S758000, C257S760000, C257SE23015, C438S612000, C438S622000, C438S627000, C438S643000, C438S653000
Reexamination Certificate
active
07663201
ABSTRACT:
The present invention provides a semiconductor device exhibiting an improved reliability. A semiconductor device comprises a semiconductor chip having an electrode on a surface thereof and a mounting substrate, and the electrode (aluminum electrode) of the semiconductor chip is coupled to the mounting substrate through a bump (solder bump104). A plurality of diffusion barrier films (UBM112) for preventing a diffusion of a material composing the bump is provided between the electrode and the bump, and the diffusion barrier film is formed to have a plurality of divided portions via spacings therebetween.
REFERENCES:
patent: 6191023 (2001-02-01), Chen
patent: 6913946 (2005-07-01), Lin
patent: 2002/0125569 (2002-09-01), Fukuda et al.
patent: 2004/0070079 (2004-04-01), Huang et al.
patent: 2005/0014356 (2005-01-01), Pozder et al.
patent: 2005/0140027 (2005-06-01), Fan
patent: 2005/0208751 (2005-09-01), Oh et al.
patent: 2000-299343 (2000-10-01), None
Landau Matthew C
Mitchell James M
NEC Electronics Corporation
Young & Thompson
LandOfFree
Semiconductor device with a diffusion barrier film having a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device with a diffusion barrier film having a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device with a diffusion barrier film having a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4207887