Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure
Reexamination Certificate
2007-01-02
2007-01-02
Soward, Ida M. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Bipolar transistor structure
C257S341000, C257S342000, C257S370000, C257S378000, C257S474000, C257S477000, C257S526000
Reexamination Certificate
active
10928927
ABSTRACT:
A semiconductor device is disclosed that reduces the reverse leakage current caused by reverse bias voltage application and reduces the on-voltage of the IGBT. A two-way switching device using the semiconductor devices is provided, and a method of manufacturing the semiconductor device is disclosed. The reverse blocking IGBT reduces the reverse leakage current and the on-voltage by bringing portions of an n−-type drift region1that extend between p-type base regions and an emitter electrode into Schottky contact to form Schottky junctions.
REFERENCES:
patent: 5023191 (1991-06-01), Sakurai
patent: 5047813 (1991-09-01), Harada
patent: 5079602 (1992-01-01), Harada
patent: 5111258 (1992-05-01), Sasaki et al.
patent: 5200632 (1993-04-01), Sakurai
patent: 5273917 (1993-12-01), Sakurai
patent: 5321281 (1994-06-01), Yamaguchi et al.
patent: 5485022 (1996-01-01), Matsuda
patent: 5536966 (1996-07-01), Robinson et al.
patent: 5557128 (1996-09-01), Yamazaki et al.
patent: 5608237 (1997-03-01), Aizawa et al.
patent: 5698454 (1997-12-01), Zommer
patent: 6034413 (2000-03-01), Hastings et al.
patent: 6091086 (2000-07-01), Zommer
patent: 6737722 (2004-05-01), Yamamoto et al.
patent: 6825565 (2004-11-01), Onishi et al.
patent: 2001/0000033 (2001-03-01), Baliga
patent: 2006/0137600 (2006-06-01), Ellison et al.
patent: 2001-185727 (A) (2001-07-01), None
patent: 2002-76017 (A) (2002-03-01), None
patent: 2002-319676 (A) (2002-10-01), None
patent: 2002-353454 (A) (2002-12-01), None
patent: 2003-17701 (A) (2003-01-01), None
Takei, M., et al., “600V-IGBT With Reverse Blocking Capability,” Proceedings of 2001 International Symposium on Power Semiconductor Devices & ICs, Osaka, vol. 11.1, pp. 413-416, Nagano, Japan.
Naito Tatsuya
Nemoto Michio
Takei Manabu
Fuji Electric Device Technology Co. Ltd.
Rossi Kimms & McDowell LLP
Soward Ida M.
LandOfFree
Semiconductor device, the method of manufacturing the same,... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device, the method of manufacturing the same,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device, the method of manufacturing the same,... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3765581