Semiconductor device testing fixture

Details Semiconductor device testing fixture Semiconductor device testing fixture

1997-02-03

1998-11-03

Hua, Ly

Excavating

371 221, 371 225, G01R 3128

Patent

active

058319948

ABSTRACT:
A semiconductor device testing fixture is provided in which the performance tests of a semiconductor device can be executed without increasing the time for testing and the equipment investment for a semiconductor tester with an increase in the practical operating frequency of a tested semiconductor device. A semiconductor device testing fixture (1A) has input terminals (2, 3, 4) and an output terminal (15) for receiving and sending a signal together with a semiconductor tester (18). These terminals are connected to the predetermined terminals of the semiconductor tester (8). A memory (7) which can perform first in first out operation is mounted as signal holding means on the semiconductor device testing fixture (1A).

REFERENCES:
patent: 4825098 (1989-04-01), Aoyama
patent: 4887267 (1989-12-01), Kanuma
patent: 5257359 (1993-10-01), Blasco et al.
patent: 5265102 (1993-11-01), Saito
patent: 5570040 (1996-10-01), Lytle et al
patent: 5701306 (1997-12-01), Arai

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