Semiconductor device testing device

Details Semiconductor device testing device Semiconductor device testing device

1985-07-31

1988-01-19

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, G01R 3128

Patent

active

047206713

ABSTRACT:
A semiconductor device testing device for testing a semiconductor device having input/output terminals includes a dynamic load circuit provided for each of the input/output terminals of the semiconductor device and a comparator provided for each of the input/output terminals of the semiconductor device which compares the voltage value obtained at the input/output terminal with a predetermined value to detect whether the internal state of the semiconductor device is a high impedance state or not. The confirmation of the electrical connection between the semiconductor device and the testing device is thereby conducted by the dynamic load circuit and the comparator.

REFERENCES:
patent: 3490041 (1970-01-01), Shapiro et al.
patent: 4651088 (1985-06-01), Sawada

Affiliated with

Also associated with

Rating

Semiconductor device testing device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device testing device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device testing device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-372881