Semiconductor device testing carrier and method of fixing semico

Details Semiconductor device testing carrier and method of fixing semico Semiconductor device testing carrier and method of fixing semico

1997-07-08

1999-11-16

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324757, G01R 3126

Patent

active

059864591

ABSTRACT:
A testing carrier has a flexible material such as a thin film employed as a supporting body which covers and thrusts a semiconductor device against a substrate. The substrate includes a plurality of contact terminals and a plurality of testing wiring patterns.

REFERENCES:
patent: 5204616 (1993-04-01), Buchanan et al.
patent: 5757199 (1998-05-01), Maruyama
patent: 5828224 (1998-10-01), Maruyama

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