Semiconductor device testing apparatus, semiconductor device...

Details Semiconductor device testing apparatus, semiconductor device... Semiconductor device testing apparatus, semiconductor device...

2006-10-24

2006-10-24

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S713000, C327S112000

Reexamination Certificate

active

07126326

ABSTRACT:
The disclosure relates to a semiconductor device testing apparatus, a semiconductor device testing system, and a semiconductor device testing method, in particular a method for measuring or trimming, respectively, the impedance of driver devices provided in a semiconductor device, wherein a device, in particular a driver device, comprising each a pull-up circuit and a pull-down circuit is used, and wherein the method includes: joint activating of both the pull-up circuit and the pull-down circuit; and determining a first current flowing through the pull-up circuit or the pull-down circuit, respectively, with jointly activated pull-up and pull-down circuits.

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