Semiconductor device testing apparatus and test method therefor

Details Semiconductor device testing apparatus and test method therefor Semiconductor device testing apparatus and test method therefor

2005-02-01

2005-02-01

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C324S765010

Reexamination Certificate

active

06850860

ABSTRACT:
In a semiconductor device testing apparatus and test method, after a pass value and fail value corresponding respectively to an upper limit and a lower limit of a test range have been set, measurement is not performed at these positions, but measurement is performed by means of a binary search method from the next position.

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