Semiconductor device tester with slanted contact ends

Details Semiconductor device tester with slanted contact ends Semiconductor device tester with slanted contact ends

2006-05-23

2006-05-23

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010

Reexamination Certificate

active

07049838

ABSTRACT:
A semiconductor tester device includes at least a probe having a plunger making contact with a semiconductor device at one end and being slanted at the other end, and an elastic member able to shrink when pressed with the plunger; and a print substrate with wiring formed to test the semiconductor device; wherein the print substrate has at least a hole to put the probe in, and the hole has an electrically conductive wall to make contact with a side end of the plunger when the elastic member is pressed at the slanted end of the plunger.

REFERENCES:
patent: 5600259 (1997-02-01), Bartyzel et al.
patent: 5734270 (1998-03-01), Buchanan
patent: 5993269 (1999-11-01), Ito
patent: 6084421 (2000-07-01), Swart et al.
patent: 6512389 (2003-01-01), Kocher
patent: 6844748 (2005-01-01), Sato et al.
patent: 10-189087 (1998-07-01), None
patent: 2001021583 (2001-01-01), None

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