Semiconductor device tester with a test waveform monitoring circ

Details Semiconductor device tester with a test waveform monitoring circ Semiconductor device tester with a test waveform monitoring circ

1990-10-19

1992-04-21

Weider, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 364487, 371 27, G01R 3128

Patent

active

051072050

ABSTRACT:
A tester for semiconductor devices such as IC memory chips is provided with an improved test waveform simulating function. The test waveform simulating circuit comprises relays for selecting one of the outputs of a plurality of drivers. The driver output selected by a relay is compared by a comparator with reference levels at reference times recurring at short intervals, thereby producing information bits corresponding to the waveform of the driver output which is displayed as a two dimensional image through a memory and display.

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