Semiconductor device tester capable of simultaneously testing a

Details Semiconductor device tester capable of simultaneously testing a Semiconductor device tester capable of simultaneously testing a

1994-12-29

1995-12-05

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 104

Patent

active

054732590

ABSTRACT:
In an IC tester configured to simultaneously test a plurality of test ICs, each of the test ICs includes a temperature sensor part for detecting the temperature of the test IC itself. A controller receives a temperature detection signal from each test IC and controls a plurality of pulse generators each provided for supplying a pulse signal to a corresponding one of the test ICs. Each pulse generator is controlled by the controller to change the frequency of the pulse signal so as to maintain the temperature of the corresponding test IC at a target temperature in common to all the test ICs to permit simultaneous testing in the IC tester.

REFERENCES:
patent: 4881591 (1989-11-01), Rignabl
patent: 5233161 (1993-08-01), Farewell et al.
patent: 5406212 (1995-04-01), Hashinaga et al.
patent: 5414370 (1995-05-01), Hashinaga et al.

Affiliated with

Also associated with

Rating

Semiconductor device tester capable of simultaneously testing a does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device tester capable of simultaneously testing a , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device tester capable of simultaneously testing a will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1376161