Semiconductor device tester

Details Semiconductor device tester Semiconductor device tester

1987-05-18

1989-02-21

Ruggiero, Joseph

Excavating

G01R 3128

Patent

active

048072290

ABSTRACT:
A semiconductor device tester comprises a random data generator, an algorithmic data generator, and a serial data generator. The test data pattern of the data generators are selected and combined to produce test pattern data actually applied to a device under test. At least part of the test data pattern from the algorithmic data generator are applied to one of the random data generator and the serial data generator, which, responsive thereto, produces the random test pattern data or the serial test pattern data.

REFERENCES:
patent: 4451918 (1984-05-01), Gillette
patent: 4639919 (1987-01-01), Chang
patent: 4652814 (1987-03-01), Groves
patent: 4736375 (1988-04-01), Tannhauser
Trillium Tester Product Specification, Rev. 1, Jan. 1986, pp. 7, 12 and 13.

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