Semiconductor device test board and method for evaluating semico

Details Semiconductor device test board and method for evaluating semico Semiconductor device test board and method for evaluating semico

1998-02-04

2000-09-05

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3500, G01R 3102

Patent

active

061148660

ABSTRACT:
A semiconductor device test board solves a problem with conventional test boards in that test results obtained through a burn-in procedure could be identified only before the test board is taken out of a burn-in oven. Hence, conventional test boards required additional steps for checking the test results after removing the test boards from the burn-in oven. This extra step prevents the efficiency of the test from being improved. One embodiment of the present test board has indicator arms, each rotatably mounted on a pivot on the test board, for indicating, in response to a signal on a signal line, the test result of the semiconductor device associated with it. Each of the indicator arms maintains its rest position when no failure has occurred in the semiconductor device associated with it during the test. Each indicator arm changes its position if a failure has occurred in the semiconductor device during the test, and retains one of the two positions until after the test board is taken out of the burn-in oven. Thus, the test result can be determined after taking out the test board from the burn-in oven.

REFERENCES:
patent: 4900948 (1990-02-01), Hamilton
patent: 5673028 (1997-09-01), Levy
patent: 5798653 (1998-08-01), Leung, Jr.

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