Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-02-13
2007-02-13
Hirshfeld, Andrew H. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S1540PB, C324S537000, C324S760020, C327S512000
Reexamination Certificate
active
10504856
ABSTRACT:
A temperature sensor including two transistors having different emitter current densities and performing temperature detection based on the fact that the difference in voltage between base and emitter changes with temperature. The temperature sensor is provided with a feedback circuit for controlling respective collector voltages and emitter currents such that the collector voltages of both transistors vary according to similar temperature characteristics.
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patent: 5094546 (1992-03-01), Tsuji
patent: 6084462 (2000-07-01), Barker
patent: 6509782 (2003-01-01), Chowdhury
patent: 6812722 (2004-11-01), Throngnumchai et al.
patent: 58-23578 (1983-05-01), None
patent: 4-31721 (1992-02-01), None
Nakamura Akira
Wachi Takatsugu
Arent & Fox PLLC
He Amy
Hirshfeld Andrew H.
Rohm & Co., Ltd.
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