Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of...
Reexamination Certificate
2006-05-25
2009-11-24
Tsai, H. Jey (Department: 2895)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
C438S336000, C438S337000, C257SE27053
Reexamination Certificate
active
07622357
ABSTRACT:
The present invention relates to a device structure that comprises a substrate with front and back surfaces, and at least one semiconductor device with a first conductive structure located in the substrate and a second conductive structure located thereover. A first conductive contact is located over the front surface of the substrate and laterally offset from the first conductive structure. The first conductive contact is electrically connected to the first conductive structure by a conductive path that extends: (1) from the first conductive structure through the substrate to the back surface, (2) across the back surface, and (3) from the back surface through the substrate to the first conductive contact on the front surface. Further, a second conductive contact is located over the front surface and is electrically connected to the second conductive structure. The conductive path can be formed by lithography and etching followed by metal deposition.
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Pagette Francois
Rieh Jae-Sung
Vaed Kunal
Volant Richard P.
International Business Machines - Corporation
Schnurmann H. Daniel
Scully , Scott, Murphy & Presser, P.C.
Tsai H. Jey
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