Semiconductor device structures for bipolar junction...

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – On insulating substrate or layer

Reexamination Certificate

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C257S571000, C257SE29033

Reexamination Certificate

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07618872

ABSTRACT:
Semiconductor device structures for use with bipolar junction transistors and methods of fabricating such semiconductor device structures. The semiconductor device structure comprises a semiconductor body having a top surface and sidewalls extending from the top surface to an insulating layer, a first region including a first semiconductor material with a first conductivity type, and a second region including a second semiconductor material with a second conductivity type. The first and second regions each extend across the top surface and the sidewalls of the semiconductor body. The device structure further comprises a junction defined between the first and second regions and extending across the top surface and the sidewalls of the semiconductor body.

REFERENCES:
patent: 5087580 (1992-02-01), Eklund
patent: 5217700 (1993-06-01), Kurihara et al.
patent: 5313090 (1994-05-01), Morikawa
patent: 5554543 (1996-09-01), Yang
patent: 5767578 (1998-06-01), Chang et al.
patent: 6638807 (2003-10-01), Forbes et al.
patent: 7202132 (2007-04-01), Zhu et al.
patent: 7205601 (2007-04-01), Lee et al.
patent: 7285469 (2007-10-01), Beasom
patent: 2004/0046233 (2004-03-01), Swanson et al.
Office Action; dated as mailed on Jan. 14, 2009 for U.S. Appl. No. 12/130,176; 5 pages; U.S. Patent and Trademark Office.
Harame, et al., “Si/SiGe Epitaxial-Base Transistors—Part II: Process Integration and Analog Applications”, IEEE Transactions on Electron Devices, vol. 42, No. 3, Mar. 1995, pp. 469-482.
Nesbit, et al., A 0.6 um2 256Mb Trench DRAM Cell With Self-Aligned BuriEd STrap (BEST), 1993 IEDM Technical Digest, pp. 627-630.
Sato, et al., “A 0.18-um RF SiGe BiCMOS Technology With Collector-Epi-Free Double-Poly Self-Aligned HBTs”, IEEE Transactions on Electron Devices, vol. 50, No. 3, Mar. 2003, pp. 669-675.

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