Semiconductor device solder bump having intrinsic potential for

Fishing – trapping – and vermin destroying

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437182, 437189, 437192, 437193, H01L 2144

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active

054707870

ABSTRACT:
A semiconductor device (32) has an as-deposited solder bump (34) having the intrinsic potential for forming an extended eutectic region for simplified DCA applications. The as-deposited solder bump (34) has first tin layer (40) overlying the UBM of the bonding pad (14) on the device. The first tin layer reacts with a metal layer (36) in the UBM to form an intermetallic for adhering the solder bump to the bonding pad. A thick lead layer (42) overlies the first tin layer to provide the substantial component of the solder bump. A second tin layer (44) overlies the lead layer to provide localized eutectic formation at the top surface of the bump during reflow. A device having at least this solder bump structure can be directly attached to either ceramic or PC board substrates. Additional layers of tin and /or lead may be supplemented to the basic bump structure to optimize the eutectic formation rate.

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Grivas, Dennis et al., "The Formation of Cu3Sn Intermetallic on the Reaction of Cu with 95Pb/5Sn Solder," Journal of Electronic Materials, vol. 15 No. 6, Nov. 1986, pp. 355-359.
Bader, W. G. "Dissolution of Au. Ag, Pd, Pt, Cu and Ni in a Molten Tin-Lead Solder," Welding Research Supplement, Dec. 1969, pp. 551-557.
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