Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-04-25
1999-08-10
Karlsen, Ernest
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
439266, G01R 3102, H01R 1122
Patent
active
059364181
ABSTRACT:
A semiconductor device socket prevents adhesion of foreign material to mounting surfaces of external leads of a semiconductor device. A positioning base of the socket supports external leads of the semiconductor device such that the lead ends of the leads do not contact a body of the socket. Movable contact terminals of the socket disposed opposite the external leads can move into and out of contact with the external leads.
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patent: 5358421 (1994-10-01), Petersen
patent: 5364284 (1994-11-01), Tohyama et al.
patent: 5461258 (1995-10-01), Ideta et al.
Ideta Yasushi
Kaneko Keiko
Kobayashi Kunio
Umetsu Tsunenori
Washitani Akihiro
Karlsen Ernest
Mitsubishi Denki & Kabushiki Kaisha
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