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Reexamination Certificate

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C257S079000, C257S094000

Reexamination Certificate

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07315050

ABSTRACT:
A semiconductor device is prepared by the use of a vapor phase method and is provided with a semiconductor layer composed of boron phosphide (BP) having a band gap at room temperature of not less than 2.8 eV and not more than 3.4 eV or a boron phosphide (BP)-base mixed crystal which contains the boron phosphide (BP) and which is represented by the formula: BαAlβGaγIn1−α−β−γPδAsεN1−δ−ε(0<α≦1, 0≦β<1, 0≦γ<1, 0<α+β+γ≦1, 0<δ≦1, 0≦ε<1, 0<δ+ε≦1).

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