Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-12-02
1998-10-13
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, G01R 3102
Patent
active
058217622
ABSTRACT:
A high-speed, high-density, small-sized, low-cost semiconductor device wherein the feeder substrate 2 for supplying power to the semiconductor elements 3 as a bare chip has the containers 2a for containing the semiconductor elements 3, the semiconductor elements 3 are bonded to the wiring layer 1b of the signal transmission substrate 1 for transmitting signals to the semiconductor elements 3 and contained in the containers 2a, the containers 2a are covered with the signal transmission substrate 1, and the signal transmission substrate 1 is superposed upon and bonded to the feeder substrate 2.
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"Bare Chip Test Techniques for Multichip Modules", Proceedings of 40th Electronic Components & Technology Conference, 1990, pp. 554-558 (Month Unavailable).
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Hamaguchi Tsuneo
Hayashi Osamu
Hoshinouchi Susumu
Ishizaki Mitsunori
Izuta Goro
Ballato Josie
Kobert Russell M.
Mitsubishi Denki & Kabushiki Kaisha
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