Electricity: measuring and testing – Impedance – admittance or other quantities representative of...
Reexamination Certificate
2004-05-17
2009-06-30
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
C324S765010
Reexamination Certificate
active
07554337
ABSTRACT:
The semiconductor device of the invention includes a circuit and a protecting structure. It is provided with a first and a second security element and with an input and an output. The security elements have a first and a second impedance, respectively, which impedances differ. The device is further provided with a measuring unit a processing unit and a connection unit. The processing unit transform any first information received into a specific program of measurement. Herewith a challenge-response mechanism is implemented in the device.
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De Jongh Petra Elisabeth
Kevenaar Thomas Andreas Maria
Tuyls Pim Theo
Wolters Robertus Adrianus Maria
Nguyen Hoai-An D
Nguyen Vincent Q
NXP B.V.
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