Semiconductor device, method for testing the same and IC card

Details Semiconductor device, method for testing the same and IC card Semiconductor device, method for testing the same and IC card

2006-08-29

2006-08-29

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07098681

ABSTRACT:
A semiconductor device has a boosting circuit configured to generate a boosting potential to an output line. An internal circuit is supplied with the boosting potential from the boosting circuit via the output line. A test line is connected to the output line. A control circuit is arranged between the output line and the test line and configured to shut off a current flowing into the test line from the output line during a boosting operation of the boosting circuit.

REFERENCES:
patent: 5705934 (1998-01-01), Drouot
patent: 2000-40792 (2000-02-01), None
patent: 2001-101883 (2001-04-01), None

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