Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings
Reexamination Certificate
2007-02-13
2007-02-13
Lee, Hsien-Ming (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
Multiple housings
C257S723000, C438S106000, C438S109000
Reexamination Certificate
active
11137704
ABSTRACT:
A semiconductor device includes a first package, a second package, a contact part for electrically coupling a first wiring pattern to a second wiring pattern, and a reinforcer. The thermal expansion coefficient of the first package is larger than that of the second package. The second package is disposed so that the second interposer overlaps the first semiconductor chip and the first interposer. The contact part is provided between the first and second interposers so that a first end is coupled to the first wiring pattern and a second end is coupled to the second wiring pattern. The reinforcer is provided to expose part of the contact part and cover the circumference of the first end of the contact part.
REFERENCES:
patent: 6388333 (2002-05-01), Taniguchi et al.
patent: 6583502 (2003-06-01), Lee et al.
patent: 6781241 (2004-08-01), Nishimura et al.
patent: 06-013541 (1994-01-01), None
patent: 11-8474 (1999-01-01), None
patent: 2001-223297 (2001-08-01), None
patent: 2002-76265 (2002-03-01), None
patent: 2003-318361 (2003-11-01), None
Communication from Japanese Patent Office regarding corresponding application.
Harness & Dickey & Pierce P.L.C.
Lee Hsien-Ming
Seiko Epson Corporation
LandOfFree
Semiconductor device, method for manufacturing the same,... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device, method for manufacturing the same,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device, method for manufacturing the same,... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3844642