Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
Reexamination Certificate
2011-06-28
2011-06-28
Young, Christopher G (Department: 1721)
Radiation imagery chemistry: process, composition, or product th
Including control feature responsive to a test or measurement
C430S296000, C430S942000, C716S054000
Reexamination Certificate
active
07968259
ABSTRACT:
In a multi-project-chip semiconductor device, semiconductor elements fabricated on a wafer have a layout that corresponds to an exposure order of a pattern of the semiconductor elements and that is based on information indicating manufacture conditions and the number of shots and are arranged such that the semiconductor elements having the same manufacture condition are adjacent to each other in ascending or descending order of the number of shots.
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Hoshino Hiromi
Maruyama Takashi
Fujitsu Semiconductor Limited
Staas & Halsey , LLP
Young Christopher G
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