Semiconductor device, method for fabricating the...

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S327000, C257S340000, C257S401000, C257S616000

Reexamination Certificate

active

06885041

ABSTRACT:
A semiconductor device comprises: a channel region14of silicon, a source region26and a drain region26respectively forming junction with the channel region14, and a gate electrode30formed on the channel region14interposing an insulation film16therebetween, either of the source region26and the drain region26being formed of SiGeC, which lattice-matches with silicon. Whereby parasitic resistance between the source region and the drain region can be much decreased.

REFERENCES:
patent: 4885614 (1989-12-01), Furukawa et al.
patent: 5914504 (1999-06-01), Augusto
patent: 5965914 (1999-10-01), Miyamoto
patent: 6064081 (2000-05-01), Robinson et al.
patent: 6143593 (2000-11-01), Augusto
patent: 6278165 (2001-08-01), Oowaki et al.
patent: 11-284171 (1999-10-01), None
J.M. Hergenrother et al.,IEDM Tech. Gig., p. 75, Sep. 1999.
M. Koyanagi et al.,IEEE Micro 18(4) 17, 1998, Jul.-Aug.
M. Ohfuti et al.,Extended Abstracts of the 1999 International Conference on Solid State Device and Materials, Tokyo, 1999, pp. 476-477.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device, method for fabricating the... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device, method for fabricating the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device, method for fabricating the... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3394190

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.