Semiconductor device low temperature test apparatus using...

Details Semiconductor device low temperature test apparatus using... Semiconductor device low temperature test apparatus using...

2005-11-29

2005-11-29

Ramirez, Nestor (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S760020, C062S003700

Reexamination Certificate

active

06970007

ABSTRACT:
A semiconductor device test apparatus, has: a socket, which connects to a semiconductor device undergoing testing mounted thereon; a test tray, which houses the semiconductor device undergoing testing and which is provided, in a position on which the semiconductor device undergoing testing is mounted, with a first electronic cooling element that absorbs heat via one surface thereof and releases heat via the other surface thereof; and a contact block, which is provided with a second electronic cooling element that makes contact with the top of the semiconductor device undergoing testing in a state in which the semiconductor device undergoing testing is mounted on the socket.

REFERENCES:
patent: 5188982 (1993-02-01), Huang
patent: 6334311 (2002-01-01), Kim et al.
patent: 53-50982 (1978-05-01), None

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