Semiconductor device lead calibration unit

Details Semiconductor device lead calibration unit Semiconductor device lead calibration unit

1996-12-26

1998-11-17

Evans, F. L.

Optics: measuring and testing

Standard

382145, 382146, G01J 102

Patent

active

058384340

ABSTRACT:
The invention is to a calibration unit (11) for use with a moveable scale reference (9) for calibration of semiconductor package outlines, the calibration unit (11) is a monolithic rectangular block which has a plurality of legs (12) formed on and integal with said rectangular block and having spacing independent from the leads on a semiconductor device.

REFERENCES:
patent: 4847911 (1989-07-01), Morimoto et al.
patent: 5115475 (1992-05-01), Lebeau
patent: 5168217 (1992-12-01), Sakaguchi
patent: 5249239 (1993-09-01), Kida
patent: 5402505 (1995-03-01), Roy et al.
patent: 5414458 (1995-05-01), Harris et al.
patent: 5490084 (1996-02-01), Okubo et al.
patent: 5563703 (1996-10-01), Lebeau et al.

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