Semiconductor device inspection template

Details Semiconductor device inspection template Semiconductor device inspection template

1989-01-18

1991-10-29

Haroian, Harry N.

Geometrical instruments

Miscellaneous

Light direction

33297, G01C 910

Patent

active

050603892

ABSTRACT:
A semiconductor device inspection template for use in visual inspection of semiconductor die or packages includes a selectively patterned transparent film mounted in a sleeve adapted for rapid placement and removal from an optical inspection instrument's optical tube.

REFERENCES:
patent: 679779 (1901-08-01), Pierpont
patent: 1182384 (1916-05-01), Kennedy
patent: 2707418 (1955-05-01), Magnuson
patent: 2853925 (1958-09-01), Lee
patent: 3119185 (1964-01-01), Gray
patent: 3546778 (1970-12-01), Lepkowski
patent: 3942896 (1976-03-01), Schneider
patent: 4172662 (1979-10-01), Vogel
patent: 4718767 (1988-01-01), Hazama

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