Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-09-02
2009-12-08
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S705000
Reexamination Certificate
active
07629802
ABSTRACT:
Provided is a semiconductor device including a determination circuit adapted to determine whether a fuse is in a connection or disconnection state. The semiconductor device includes a first and second power supply terminals, a measuring terminal, and at least one trimming detection circuit connected between the measuring terminal and one of the first and second power supply terminals. The trimming detection circuit is constructed by a current supplying element, a series arrangement of a fuse and a switch element, and the determination circuit. The current supplying element and series arrangement are connected in series between the measuring terminal and the one of the first and second power supply terminals. The determination circuit has an input connected to a node between the current supplying element and series arrangement. A voltage at the other of the first and second power supply terminals is applied to the measuring terminal in a normal mode.
REFERENCES:
patent: 6307801 (2001-10-01), Ogawa et al.
patent: 2003/0006466 (2003-01-01), Kimura
patent: 2003/0090274 (2003-05-01), Kitade
patent: 1062477 (1998-03-01), None
NEC Electronics Corporation
Nguyen Vincent Q
Sughrue & Mion, PLLC
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