Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2007-08-24
2009-06-02
Menz, Douglas M (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C438S627000
Reexamination Certificate
active
07541675
ABSTRACT:
A semiconductor device including a fluorine diffusion barrier layer and a method for manufacturing the same are provided. The semiconductor device includes a specific pattern formed over a semiconductor substrate, a fluorine diffusion barrier layer formed over the specific pattern, and an interlayer insulating layer containing fluorine formed over the fluorine diffusion barrier layer. The fluorine diffusion barrier layer may be used to essentially prevent fluorine from being diffused into a specific pattern formed of a metal or tetra-ethyl-ortho-silicate (TEOS) layer and thus to prevent corrosion and void formation that might otherwise be caused by HF.
REFERENCES:
patent: 6764940 (2004-07-01), Rozbicki et al.
patent: 2007/0128860 (2007-06-01), Hou et al.
patent: 1020030001937 (2003-01-01), None
patent: 1020040049801 (2004-06-01), None
Dongbu Hi-Tek Co., Ltd.
Menz Douglas M
Sherr & Vaughn, PLLC
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