Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2011-08-02
2011-08-02
Nguyen, Danny (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
C361S111000
Reexamination Certificate
active
07990667
ABSTRACT:
A semiconductor device includes a first circuit block powered by voltages at first and second power supply terminals, a second circuit block powered by voltages at third and fourth power supply terminals, a first ESD (electrostatic discharge) protection circuit including a first field effect transistor having a source, a drain, and a gate, where the gate and one of the source and the drain are connected to the first power supply terminal, the other of the source and the drain is connected to the third power supply terminal, and a first back gate potential adjusting circuit adapted to adjust a potential at a back gate of the first field effect transistor. The first field effect transistor includes a first conductivity type transistor formed in a first well of a second conductivity type serving as the back gate of the first field effect transistor.
REFERENCES:
patent: 6011681 (2000-01-01), Ker et al.
patent: 6075686 (2000-06-01), Ker
patent: 6208494 (2001-03-01), Nakura et al.
patent: 2004/0212936 (2004-10-01), Salling et al.
patent: 63-36557 (1988-02-01), None
McGinn IP Law Group PLLC
Nguyen Danny
Renesas Electronics Corporation
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